Xiaochen Zhu

Technologist
Sandisk Technologies Inc
Milpitas, CA
USA

Papers:

Understanding the Root Cause of Transient Failures in NAND-Type 3D Flash Memory
Localization of Gate Oxide Defects in Pool Capacitors in NAND-type 3D Flash memory
Failure analysis methods to localize defects in data path on 3D Flash memory products