Power Devices (Si, SiC, GaN)
Wednesday, October 7, 2026: 4:20 PM-5:00 PM
Dr. Christopher H. Kang, Thermo Fisher Scientific and Prof. Rosine COQ GERMANICUS, Normandie Univ, Ensicaen, Unicaen, CNRS, CRISMAT UMR6508
4:20 PM
On the Impact of Proton Irradiation on TDDB Reliability of SiC MOSFETs
Prof. Rosine COQ GERMANICUS, Normandie Univ, Ensicaen, Unicaen, CNRS, CRISMAT UMR6508;
Dr. Kimmo NISKANEN, Accelerator Laboratory, Department of Physics, University of Jyvaskyla;
Dr. Tanguy PHULPIN, Université Paris-Saclay, CentraleSupélec, CNRS, GeePs, Sorbonne Université;
Prof. Pascal Dherbecourt, University of Rouen;
Dr. Niemat Moultif, University of Rouen;
Dr. Guillaume Bascoul, Centre National d'Etudes Spatiales (CNES)
