Device Analysis - Case Studies II

Tuesday, October 6, 2026: 3:20 PM-3:40 PM
206 A-B (Henry B. González Convention Center)
3:20 PM
Resolving Open Metal Line Defects Driving Logic Emission in a 90-nm Copper based Process Technology using SEM-based Localization and Circuit Analysis
Cheska Amante, Analog Devices Inc.; Camille Joyce Garcia-Awitan, Analog Devices Inc.
See more of: Technical Program
<< Previous Session | Next Session >>