Session 1: Emerging Concepts and Techniques

Bruce, Michael

Monday, November 12, 2012: 9:55 AM-12:25 PM

101AB (Phoenix Convention Center)

Session Chairs:

Dr. Michael Bruce and Mr. David Vallett

9:55 AM

1.1

Closer to the Theoretical Limit: Spherical Corrections to Aplanatic Solid Immersion Imaging with Adaptive Optics
Mr. Yang Lu, Boston University; Euan Ramsay, Boston University; Christopher R. Stockbridge, Boston University; Abdulkadir Yurt, Boston University; F. Hakan Köklü, Boston University; Thomas G. Bifano, Boston University; M. Selim Ünlü, Boston University; Bennett B. Goldberg, Boston University

10:20 AM

1.2

Fault Isolation of Open Defects Using Space Domain Reflectometry
Dr. Mayue Xie, Intel corp; Dr. Zhiguo Qian, Intel corp; Dr. Mario Pacheco, Intel corp; Dr. Zhiyong Wang, Intel corp; Dr. Rajen Dias, Intel corp; Dr. Vladimir Talanov, Neocera Inc

10:45 AM

1.3

Localization of Dead Open in a Solder Bump by Space Domain Reflectometry
Dr. Vladimir Talanov, Neocera Inc; Jan Gaudestad, Neocera LLC; Dr. Antonio Orozco, Neocera; Mr. Nicolas Gagliolo, Neocera; Mr. David Vallett, IBM Systems and Technology Group; Mr. Daniel Bader, IBM Systems and Technology Group

11:10 AM

1.4

Advanced Fault Isolation Technique using Electro Optical Terahertz Pulse Reflectometry (EOTPR) for 2D and 2.5D Flip chip package
Dr. Lihong Cao, Advanced Micro Devices; Manasa Venkata, Advanced Micro Devices; Meng Yeow Tay, Advanced Micro Devices; Wen Qiu, Advanced Micro Devices; J. Alton, TeraView Limited; P. Taday, TeraView Limited

11:35 AM

1.5

Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal
Dr. Tomas Hrncir, TESCAN, a.s.; Dr. Anne Delobbe, Orsay Physics S.A.; Dr. Olivier Salord, Orsay Physics S.A.; Dr. Filip Lopour, TESCAN, a.s.; Dr. Martin Zadrazil, TESCAN, a.s.; Dr. Pierre Sudraud, Orsay Physics S.A.

12:00 PM

1.6

FemtoFarad/TeraOhm Endpoint Detection for Microsurgery of Integrated Circuit Devices
Mr. Jim Colvin, FA Instruments

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