Technology Specific FA

Sunday, November 11, 2012: 1:00 PM-7:00 PM

102A (Phoenix Convention Center)

Session Chairs:

Mr. Jeremy A. Walraven and Mr. Mark Jenkins

1:00 PM

The Role of Nanoprobing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs

2:00 PM

Limits of Bitmapping and Know-How based Defect Localization in DRAM Devices
Dr. Martin Versen, University of Applied Sciences Rosenheim

3:00 PM

Emerging Failure Modes of Advanced Technology
Mr. Terence Kane, IBM

4:00 PM

LEDs Inside and Out
Dr. Martine Simard-Normandin, MuAnalysis Inc.

5:00 PM

Diagnosing Analog Circuit Failures
Dr. David Grosjean, Analog Devices Inc.

6:00 PM

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