Dr. Franco Stellari

IBM Research
1101 Kitchawan Road
PB Box 218
Yorktown Heights, NY
USA 10598

Papers:
Novel NIR Camera with Extended Sensitivity and Low Noise for Photon Emission Microscopy of VLSI Circuits Applications and Techniques for 2D Picosecond Imaging for Circuit Analysis Automated Mapping of Very Large Areas of VLSI Circuit using SIL Ultra-Low Voltage TRE Measurements from 32 nm SOI CMOS Integrated Circuits