40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Alan Weger

IBM Research
1101 Kitchawan Road
PB Box 218
Yorktown Heights, NY
USA 10598

Papers:
Novel NIR Camera with Extended Sensitivity and Low Noise for Photon Emission Microscopy of VLSI Circuits Applications and Techniques for 2D Picosecond Imaging for Circuit Analysis Ultra-Low Voltage TRE Measurements from 32 nm SOI CMOS Integrated Circuits

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General Information

November 09 - 13, 2014


Houston, TX