40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Sample Prep User Group

Thursday, November 13, 2014: 12:20 PM-2:20 PM
Grand Ballroom B (George R. Brown Convention Center )
12:20 PM
Re-Packaging Challenges for FA, By Monte Drennan, Priority Packaging, Inc.
12:50 PM
Sample Preparation for Enhanced LIT Isolation, By Eddy Chua Bok Khoon, Infineon
1:20 PM
Advancements in Sample Preparation, By Chris Richardson, Allied High Tech Products, Inc.
1:50 PM
Milli-to-Nano, Helios PFIB Dual Beam, a Single-Tool Workflow for EFI-to-PFA, By Roger Alvis, FEI Corporation
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General Information

November 09 - 13, 2014


Houston, TX