30
Microscopy - Posters

Wednesday, November 4, 2015: 1:30 PM-3:30 PM
Exhibit Hall D (Oregon Convention Center )
Session Chairs:  Mr. Carl Nail, Failure Analysis Services, MTE Division, Evans Analytical Group, LLC, Irvine, CA and Dr. Tom Schamp, NSD, Hitachi High Technology America Inc., Dallas, TX
30.1
A Study of How Different FIB Beam Current Intensities Locate Possible Defects
Mr. Wen Chen Hsu, United Microelectronics Corporation; Mr. Yu Hsiang shu, United Microelectronics Corporation
30.2
Studies on A Qualification Method (OSSD) of Microchip Al Bondpads
Dr. Younan Hua, WinTech Nano-Technology Services Pte. Ltd.
See more of: Technical Program
<< Previous Session | Next Session >>