Dr. Yuanjing (Jane) Li

NVIDIA
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050

Papers:

Finfet SRAM Bitmap Validation Using Near Infrared Laser-Induced Damage
Capturing Defects in Flip-Chip CMOS Devices Using Backside EBAC Technique and SEM Microscopy
Visible Light Probing Sample Thinning using Targeted Lapping