Mr. Chong Khiam Oh

Manager
GLOBALFOUNDRIES Inc.
Malta, NY
USA 12020

Papers:

Conductive Thin Film Fail Detection in 20 nm and 14nm technologies
Process Flow employed for Parametric Test Structure Chain Opens Fault Isolation in 20 nm and sub-20 nm technologies in high throughput Foundries
Conductive-AFM for Scan Logic Failure Analysis at Advanced Technology Nodes