Mr. Gregory M. Johnson

GLOBALFOUNDRIES
Physical Failure analyisis
Hopewell Junction, NY
USA 12533

Papers:

Electron Beam Induced Resistance CHange (EBIRCH) for Device Characterization and Defect Localization
Multi-Photon OBIC for Device characterization and Defect Localization
Technique Selection for Front End of Line Defect Localization in Bulk Si FA