Dr. Jeffrey C. Lam

V.P.
GLOBALFOUNDRIES Singapore Pte Ltd
Product, Test and Failure Analysis
Singapore Singapore 738406

Papers:

Enhanced Static Fault Localization Methodology on Resistive Open Defects using Photon Emission Microscopy and Layout Defect Prediction
Failure Analysis Methodology on Systematic Polar failing pattern due to higher Solder Bump Resistance issue in RF SOI device
MEMS Failure Analysis In Wafer Fabrication
Approaches to Debug Common Yield Limiters