Case Studies and FA Process - Poster

Wednesday, November 9, 2016: 1:30 PM-3:30 PM
Chairs:  Dr. Yan Li, Intel, Chandler, AZ
Co-chairs:  Mr. Apek Mulay, Mulay's Consultancy Services, Tustin, CA and Ms. Jaya Chowdhury, Chem Trace, Fremont, CA
Studies and Application of Auger Monitoring System for Quality
Dr. Younan Hua, WinTech Nano-Technology Services Pte. Ltd.
Accelerating technology development and yield ramp on first Silicon utilizing a dynamic EFA system
Mr. Mason sun, SMIC; Chun-Cheng Tsao, FEI Company
Located single device leakage path of the 0.13um VLSI via Lock-in Thermography
Dr. Chao-Cheng Ting, Faraday Technology Corp.
Failure Analysis of Single-bit Charge Loss after Stress and Studies on Silicon Dopant Profile
Mr. Rong-wei Gong, Macronix International Co. Ltd.; Mr. Hsiao Tien Chang, Macronix International Co. Ltd.; Ms. Hui-Wen Chan, Macronix International Co. Ltd.; Mr. Lian-Feng Lee, Macronix International Co. Ltd; Dr. Chih-Ching Shih, Macronix International Co. Ltd; Mr. Albert Kuo, Macronix International Co. Ltd; Mr. D.J. Lin, Macronix International Co. Ltd; Tse-Jen Wang, Macronix International Co. Ltd
Lift-out Moving Mass of MEMS Gyroscope for Failure Analysis
Mr. Nathan Wang, Maxim Integrated; Dr. george perreault, Maxim Integrated; Mr. Saunil Shah, Maxim Integrated
A Case Study of Failure Analysis and root identification on ESD-induced Breakdown
Prof. Hongmin Liu, National Space Science Center, Chinese Academy of Sciences
FA process improvement and Equipment security enhancement using Barcode System
Mr. Andrew Sabate, On-semiconductor; Mr. Em Julius De La Cruz, On-semiconductor; Mr. Christopher Rieck, On-semiconductor
See more of: Technical Program
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