Introduction - Opening Session

Monday, November 7, 2016: 8:00 AM-9:15 AM
121AB (Fort Worth Convention Center)
8:00 AM
Opening Remarks: Marten Keim
8:10 AM
ISTFA 2015 Best and Outstanding Paper Awards: Jay Demarest
8:15 AM
Technical Program Introduction: Efrat Moyal
8:20 AM
Student Update: Felix Beaudoin
8:25 AM
Imaging of Strain from Deep Trenches using X-Ray Diffraction Imaging (XRDI)
Mr. Jeff Gambino, ON Semiconductor; Y. Watanabe, ON Semiconductor; Y. Kanuma, ON Semiconductor; B. Greenwood, ON Semiconductor; D. Price, ON Semiconductor; A. Suwhanov, ON Semiconductor; S. Hose, ON Semiconductor; O. Whear, Bruker
8:45 AM
ESREF Best Paper - Unusual defects generated by wafer sawing: an update, including pick & place processing, Peter Jacob, EMPA, Switzerland
See more of: Technical Program
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