Ms. Esther P.Y. Chen

Manager
GLOBALFOUNDRIES Inc.
Malta, NY
USA 12020

Papers:

Application of Conductive-AFM in Soft Failure Analysis
Conductive-AFM for Failure Analysis of Parametric Test Structures in Advanced Technology Development
Nanoprobing Beyond 14nm with Latest Generation SEM-based Nano-probers
EBAC for Isolating Partially-Localized FEOL Electrical Shorts on Test Structures During Sub-14nm Technology Development