Fault Isolation - POSTER

Wednesday, October 31, 2018: 2:20 PM-4:20 PM
Mr. Joe Caroselli, AMD and Dr. Keith A. Serrels, NXP Semiconductors
A discussion of dielectric film deformation by E-beam energy
Ms. Yu-Xiu Chen, Macronix International Co., Ltd.; Ms. Pei-Ning Hsu, Macronix International Co., Ltd.; Ms. Yu-Min Chung, Macronix International Co., Ltd.; Dr. Hsin-Cheng Hsu, Macronix International Co., Ltd.; Mr. Huai-San Ku, Macronix International Co., Ltd.; Mr. Chin-Chih Yeh, Macronix International Co., Ltd.; Mr. Nan-Tzu Lian, Macronix International Co., Ltd.; Mr. Ta-Hone Yang, Macronix International Co., Ltd.; Mr. Kuang-Chao Chen, Macronix International Co., Ltd.; Dr. Chih-Yuan Lu, Macronix International Co., Ltd.
Advanced T-LSIM System Detections using Amplified External Isolated Source-Sense Unit
Mr. Zhi Jie Lau, ON Semiconductor; Mr. Chris Phillips, ON Semiconductor
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