Mr. Greg Johnson

Sr. Applications Development
ZEISS Research Microscopy Solutions
Probing
Peabody, MA
USA 01960

Papers:

Combining three-dimensional FIB-SEM imaging and EBIC to characterize power semiconductor junctions
In-situ Junction Analysis in SiC (and GaN)
Power Electronics Failure Analysis
Tomography of electrical data in advanced-node SRAMs
AFM-in-SEM on IGBT lamella