Mr. P.T. Ng

Engineer
Globalfoundries Singapore Pte Ltd.
QRA-EFA
Singapore Singapore 738406

Papers:

Revolutionizing Failure Analysis: EBAC Nanoprobing Analysis Insights into Inaccessible Floating Gates of Advanced Tech Node Automotive NVMs
Cross-Sectional Passive Voltage Contrast Technique on FinFET Metal-Gate Breakdown Defect Isolation and Visualization for TEM Analysis
IC Backside De-processing Physical Failure Analysis with Laser Ablation Technique
Using FIB grooving to prepare top-down-nanoprobed sample for site-specific cross-sectional nanoprobing analysis