Dr. Sebastian Brand

Team Leader
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle, Saxony-Anhalt
Germany 6120

Papers:

Tutorial: Defect localization by Lock-In-Thermography
Tutorial: Defect localization by Acoustic Microscopy
Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Identification of Counterfeit Integrated Circuits using a Low-Cost Near-Field Microprobe Scanning Setup
Non-Destructive Defect Localization Based on Anomaly Detection in Acoustic Signals using Autoencoders
Quantitative 3D-Defect Localization using Lock-In Thermography based on Lateral Phase Characteristics