Dr. William Hubbard, PhD

CEO
NanoElectronic Imaging, Inc.
Riverside, CA
USA 92506

Papers:

Optimized Ga FIB Lift-Out and Ar Ion Beam Milling for High-Quality STEM-EBIC TEM Specimens
Advanced STEM EBIC: Concepts and Applications
Microscopy Analysis and Material Characterization - Live Imaging of Radiation-Induced Electronic Damage with STEM EBIC