51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Dr. Nirakar Poudel
Senior Failure Analysis Enginner
NVIDIA
San Jose, CA
USA 95121
Papers:
Novel looping methodology for Laser Voltage Probing of stuck-at and at-speed fails in SSN architecture
CAD Alignment Methodologies for Accurate and Reliable Optical Fault Isolation at Sub-5nm Process Technologies
Investigating Decap LVP for On-Die Dynamic Voltage Droop Measurement