Microscopy Analysis and Material Characterization II

Monday, November 17, 2025: 3:00 PM-4:00 PM
3 (Pasadena Convention Center)
3:00 PM
A novel beam-tilt technique in transmission electron microscopy (TEM): application for semiconductor use cases
Dr. Chu-Ping Yu, Thermo Fisher Scientific; Dr. Chunhua Tang, Thermo Fisher Scientific; Dr. Chen Li, Thermo Fisher Scientific; Dr. Dominique Delille, Thermo Fisher Scientific; Dr. Aidan Arthur Taylor, Infineon Technologies Austria AG; Dr. Paola Favia, imec; Dr. Olivier Richard, imec; Dr. Roger Loo, imec, Ghent University
3:20 PM
Dual-Mode 3D X-Ray Imaging for Failure Analysis of Complex Semiconductor Packages
Jeff Gelb, Sigray Inc; Dr. Chuyuan Zheng, Sigray Inc; Vikaram Singh, Sigray Inc; Dr. Anasuya Adibhatla, Sigray Inc; S.H. Lau, Sigray Inc; Sylvia Lewis, Sigray Inc; Dr. Wenbing Yun, Sigray Inc
3:40 PM
An optimized nano source for advancing X-ray inspection in the AI era
Dr. Christopher Nicholson, Comet X-ray
See more of: Technical Program
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