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Session 12: Photon Based Techniques - 2

Thursday, November 7, 2013: 10:05 AM-11:45 AM
Meeting Room 230B (San Jose McEnery Convention Center)
Session Chairs:
Dr. Frank Zachariasse and Dr. Herve Deslandes
10:05 AM
12.1
Dynamic Differential Thermal Measurements for Reliability and Failure Analysis
Dr. R. Aaron Falk, Quantum Focus Instruments; Mrs. Tram Pham, Quantum Focus Instruments; Mr. Anthony Ruiz, Quantum Focus Instruments
10:30 AM
12.2
Thermal Laser Stimulation Technique for AlGaN/GaN Hemt Technologies Improvement
Mr. Dominique Carisetti, Thales Research and Technology; Dr. Nicolas Sarazin, Thales Research and Technology; Prof. Nathalie Labat, IMS Laboratory; Prof. Nathalie Malbert, IMS Laboratory; Dr. Benoit Lambert, UMS; Dr. Arnaud Curutchet, IMS Laboratory; Dr. Karine Rousseau, SERMA TECHNOLOGIES; Dr. Eddy Romain-latu, SERMA TECHNOLOGIES
10:55 AM
12.3
Fault Localization of Metal Defects With Si-CCD Camera in Analog Device Functional Failure
Dr. Stephane Alves, Freescale Semiconducteurs France SAS, Toulouse; Mr. Thomas Zirilli, Freescale Semiconducteurs France SAS, Toulouse; Mr. Philippe Rousseille, Freescale Semiconducteurs France SAS, Toulouse
11:20 AM
12.4
Novel Defect Detection Using Laser-Based Imaging and TIVA With a Visible Laser
Ms. Mary A. Miller, Sandia National Laboratories; Paiboon Tangyunyong, Sandia National Laboratories; Edward I. Cole Jr., Sandia National Laboratories; Alejandro Pimentel, Sandia National Laboratories; Darlene M. Udoni, Sandia National Laboratories
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