Dr. Jie Zhu

GLOBALFOUNDRIES Singapore
QRA-FA
60 Woodlands Industrial Park D, Street 2
Singapore Singapore 738406

Papers:
Tri-Directional TEM Failure Analysis on Sample Prepared By in-Situ Lift-out FIB and Flipstage Observation of Channel Strain Release in pMOS Device with Low Idsat Using Energy-Filtered Nano-Beam Diffraction Technique Application of Automated FIB for TEM Sample Preparation in Semiconductor Failure Analysis Understanding the Cu Void Formation by TEM Failure Analysis