40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Ming Li

Semiconductor Manufacturing International (Shanghai) Corp.
18 Zhangjiang Road China 201203
Shanghai China 201203

Papers:
TEM Sample Preparation Methods for MEMS Floating Structure Analysis Development of Productive Polishing TEM Sample Preparation Methodology A Novel Method for the Specified Site Planar View TEM Sample Preparation Optimization of TEM Sample Preparation to Reduce the Overlapping of TEM Images

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 09 - 13, 2014


Houston, TX