41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015): http://www.asminternational.org/web/ISTFA-2015/home

41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015

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Mr. Scott Silverman

President
Varioscale, Inc
1782 La Costa Meadows Drive
Suite 103
San Marcos, CA
USA 92078

Papers:
1.1 Visible Light LVP on Bulk Silicon Devices 19.2 Adaptive Grinding and Polishing of Silicon Integrated Circuits to Ultrathin Remaining Thickness 19.3 The Changing Role of Advanced Sample Preparation in X-ray Inspection Supporting 2.5D and 3D Sample Failure Analysis 28.1 A Combination Continuous Wave and Pulse Laser Assisted Chemical Etching Processes through Encapsulated IC Packaging

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General Information

November 01 - 05, 2015


Portland, OR