13
Diagnostic Testing, Scanning and Debug

Wednesday, November 4, 2015: 3:30 PM-4:45 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Session Chairs:  Mr. Geir Eide, Silicon Test Solutions, Mentor Graphics, Wilsonville, OR and Mr. Mark E. Kimball, Failure Analysis, Maxim Integrated Products, Inc., Hillsboro, OR
3:30 PM
13.1
Tester Assisted Multiple Emission Microscopy
Dr. Christian Hollerith, Infineon tech. AG; Mr. Gerhard Borgmann, Infineon tech. AG; Wolfgang Schaller, Infineon tech. AG; Christof Brillert, Infineon tech. AG; Mr. Christian Burmer, Infineon tech. AG
3:55 PM
13.2
FASTKIT : A software tool for Easy Design Visibility and Diagnostic Enhancement for Failure Analysis
Mr. Etienne Auvray, ST microelectronics; Mr. Paul Armagnat, ST microelectronics
4:20 PM
13.3
Strategy To Address Low DPPM Failure Mechanisms On Automotive Grade WI-FI Radio Frequency Devices
Dr. Kai Wang, CSR plc; Ms. Sadia lone, CSR plc; Mr. Rhys Weaver, CSR plc
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