Microscopy - Poster

Wednesday, November 9, 2016: 1:30 PM-3:30 PM
Chairs:  Mr. Ted Kolasa, Electrical Engineering, Orbital ATK, Chandler, AZ
Co-chairs:  Dr. Yu Zhu, IBM TJ Watson Research Center, Yorktown Heights, NY
Charging reduction method for Auger analysis on imide surface
Ms. Nurhanani Zakaria, Infineon Technologies (Kulim) Sdn Bhd; Ms. Saw Sing Lim, Infineon Technology (Kulim) Sdn. Bhd.
Physical analysis approach to investigate copper solderable front side discoloration issue
Ms. Saw Sing Lim, Infineon Technology (Kulim) Sdn. Bhd.
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