Nanoprobing and Electrical Characterization II

Tuesday, November 12, 2019: 1:00 PM-2:40 PM
D 137/138 (Oregon Convention Center)
Sweta Pendalaya, DCG Systems and Mr. John Sanders, Thermofisher
1:00 PM
Transistor Level Reliability Assessment of Gate Oxide Defects by BTI Stress Nanoprobing
Mr. David Albert, IBM; Mr. Michael Tenney, IBM; Zhigang Song, IBM; Mr. Patrick McGinnis, IBM; Mr. Johns Oarethu, IBM
1:25 PM
Capacitance Characterization of Gate to LDD Overlap region to understand subtle fail modes in advanced node technologies
Mr. Satish Kodali, GLOBALFOUNDRIES Inc.; Dr. Edmund Banghart, GLOBALFOUNDRIES; Dr. Jagar Singh, GLOBALFOUNDRIES Inc.; Mr. Kevin Davidson, Global Foundries; Dr. Yu Zhang, GLOBALFOUNDRIES Inc.; Mr. Chong Khiam Oh, GlobalFoundries
1:50 PM
Root Cause Analysis of High Input Offset Voltage in Mixed-Signal Design Through Nanoprobing and Cadence Simulation
Dr. Zhenni Wan, Maxim Integrated; Dr. Weikai Yin, Maxim Integrated; Mr. Yining Zang, Maxim Integrated; Mr. Madhukar Karigerasi, Maxim Integrated; Mr. Saurabh Kulkarni, Maxim Integrated; Mr. Wui Chung Yap, Maxim Integrated; Dr. Dian Yu, Maxim Integrated; Dr. Nathan Wang, Maxim Integrated; Ms. Qindi Wu, Maxim Integrated
2:15 PM
Failure Analysis on Inter Polysilicon Oxide Reliability Issues of 40nm Automotive NVM Device
Mr. P. K. Tan, Globalfoundries Singapore Pte Ltd.; Mr. Fransiscus Rivai, Globalfoundries Singapore Pte Ltd.; Dr. Y. L. Pan, Globalfoundries Singapore Pte Ltd.; Ms. H. H. W. Thoungh, Globalfoundries Singapore Pte Ltd.; Dr. Siong Luong Ting, Globalfoundries Singapore Pte Ltd.; Mr. Y.Z. Zhao, Globalfoundries Singapore Pte Ltd.; Mr. T.L. Wee, GLOBALFOUNDRIES Singapore Pte. Ltd.; Dr. H tan, Globalfoundries Singapore Pte Ltd.; Dr. Changqing Chen, Globalfoundries Singapore Pte Ltd.; Ms. Soh Ping Neo, Globalfoundries Singapore Pte Ltd.; Mr. Man Hon Thor, Globalfoundries Singapore Pte Ltd.
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