Dr. Sebastian Brand

Team Leader
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle Germany 06120

Papers:

Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Electrons vs. Photons: Assessment of Circuit’s Activity Requirements for E-beam and Optical Probing Attacks
Advances in high-resolution non-destructive defect localization based on Machine Learning enhanced signal processing
Lock-in thermography for the localization of security hard blocks on SoC devices
Non-destructive Defect Localization by Scanning Acoustic Microscopy and X-ray Imaging