Dr. Domenico Mello

CTM Physics Lab Manager
STMicroelectronics
Catania Manufacturing
catania Italy 951212

Papers:

A Multiscale and Multimodal Correlative Microscopy Workflow to Characterize a Copper Segregation Identified in Epitaxial Layer in Power MOSFETs
In-situ Junction Analysis in SiC (and GaN)
A Different Approach for Failure Fault Isolation in 4H-SiC Power Devices Using Thermal Analysis
Power Electronics Failure Analysis