Device Analysis - Case Studies I

Tuesday, November 18, 2025: 10:30 AM-11:50 AM
2 (Pasadena Convention Center)
Mr. Greg Johnson, Carl Zeiss Microscopy and Dr. Yuyan Wang, Texas Instruments
10:30 AM
Fault Isolation FA Methodology on Multi-Bonded Device
Mrs. Anne Lorraine Angustia, Analog Devices; Mr. Gilbert Ruiz, Analog Devices; Mr. Arnulfo Evangelista, Analog Devices
10:50 AM
Uncovering the True Root Cause: Fabrication Defects Behind EOS-like Failures in GaAs MIM Capacitor Structures
Mrs. Alex Marionne Quarteros, Analog Devices, Inc.; Mr. Arnulfo Evangelista, Analog Devices Inc; Mr. Kojo Appiah, Analog Devices, Inc.; Mr. Tejinder Gandhi, Analog Devices, Inc.
11:10 AM
Effective Failure Analysis Approach in Locating Circuit Level Continuity Defects
Mr. Raymond G. Mendaros, Analog Devices General Trias (ADGT); Ms. Jolina May Matibag, Analog Devices General Trias (ADGT); Mr. Christian reyes, Analog Devices General Trias (ADGT); Mr. Ricardo Calanog, Analog Devices General Trias (ADGT); Mr. Robin Evangelista, Analog Devices General Trias (ADGT)
11:30 AM
Characterization and Resolution of a Missing Spacer Defect
Alexander Maggiacomo, GlobalFoundries; Ryan Rettmann, GlobalFoundries; David Hilscher, GlobalFoundries; Minrui Wang, GlobalFoundries; Matthew Zotta, GlobalFoundries; Ryan Sweeney, GlobalFoundries; Kevin Davidson, GlobalFoundries; Zin Nwe Tun, GlobalFoundries; Esther Chen, GlobalFoundries
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