AI Applications for Failure Analysis II

Tuesday, November 18, 2025: 12:50 PM-2:50 PM
1 (Pasadena Convention Center)
12:50 PM
AI-based image segmentation for the characterization of bond pads after
Mr. Dirk Utess, GlobalFoundries; Dr. Martin Weisheit, GlobalFoundries; Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH
1:10 PM
Non-Destructive Defect Localization Based on Anomaly Detection in Acoustic Signals using Autoencoders
Mr. Lorenz Heinemann, Fraunhofer IMWS; Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Mr. Michael Koegel, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Mr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems
1:30 PM
Advanced method for 3D FIB tomography AI supported on SRAM I/O circuit block with missing data bits problems
Dr. Domenico Mello, EM Microelectronic, a Company of the Swatch Group; Dr. Guillaume Fiannaca, EM Microelectronic, a Company of the Swatch Group; Dr. Filippo Marinelli, EM Microelectronic, a Company of the Swatch Group; Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH; Dr. Flavio Cognigni, Carl Zeiss SpA; Dr. Giulio Lamedica, Carl Zeiss SpA; Ms. Angelica Accorinti, University of Rome "la Sapienza"; Prof. Marco Rossi, Sapienza University of Rome
1:50 PM
A step towards automation in failure analysis by FIB-SEM 3D tomography and AI segmentation
Mr. Pascal Limbecker, GlobalFoundries Dresden Module One LLC & Co. KG; Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH; Dr. Rong Wu, GlobalFoundries Dresden Module One LLC & Co. KG; Dr. Daniel Plencner, Carl Zeiss Microscopy GmbH
2:10 PM
Managing complex FA workflows with LLM-based reasoning and acting agents
Ms. Aline Dobrovsky, University of the Bundeswehr Munich; Dr. Konstantin Schekotihin, Universität Klagenfurt; Mr. Christian Burmer, Infineon Tech. AG
2:30 PM
AIDA: AI Detection of Anomalies for failure analysis at the single-transistor level
Dr. Chaitanya Gadre, PhD, Intel; Dr. Li-sheng Wang, PhD, Intel; Dr. Junchi Wu, PhD, Intel; Dr. Suk Chung, PhD, Intel; Dr. Sung Lim, PhD, Intel
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