FA Processes Case Studies II
Wednesday, October 31, 2018: 8:00 AM-9:40 AM
225AB (Phoenix Convention Center)
Dr. Chuan Zhang, GLOBALFOUNDRIES Inc. and Dr. Erwin Hendarto, Silicon Labs
8:25 AM
Soft Single-Bit Failure on Power Fluctuation by Concurrent Operation
Mr. Keunchul Ryu, Samsung Electronics Co.,Ltd;
Dr. Nam incheol, samsung electronics;
Mrs. Kim jinseon, samsung electronics;
Mr. Daesun Kim, Samsung Electronics Co.,Ltd;
Mr. Hongsun Hwang, Samsung Electronics;
Dr. Taeyoung Oh, Samsung Electronics;
Mr. Jonghoon Kim, Samsung Electronics;
Mr. Seongjin Jang, Samsung Electronics
9:15 AM
Ambient Temperature Thermally Induced Voltage Alteration (TIVA) for Identification of Defects in Superconducting Electronics
Mr. Mark Jenkins, Sandia National Laboratories;
Dr. Paiboon Tangyunyong, Sandia National Laboratories;
Dr. Nancy A. Missert, Sandia National Laboratories;
Dr. Igor V. Vernik, HYPRES;
Dr. Alex Kirichenko, HYPRES;
Dr. Oleg Mukhanov, HYPRES;
Mr. Alexander Wynn, MIT Lincoln Laboratory;
Mrs. Alexandra L. Day, MIT Lincoln Laboratory;
Vladimir Bolkhovsky, MIT Lincoln Laboratory;
Mr. Leonard Johnson, MIT Lincoln Laboratory
