Design for Analysis, Test and Diagnostics
Tuesday, October 6, 2026: 10:10 AM-11:00 AM
Jayant D'Souza, Siemens and Arpan Bhattacherjee, NVIDIA Corporation
10:50 AM
Study on Characteristic Degradation Induced by Unused Dummy Patterns in Open Bitline DRAM
Mr. Hyunggon KIM, Samsung Electronics;
Mr. Seunghun Lee, Samsung Electronics;
Mrs. Jingyeong Seol, Samsung Electronics;
Mr. Dongguk Han, Samsung Electronics;
Mrs. Jinseon Kim, Samsung Electronics;
Dr. Minju Shin, Samsung Electronics;
Dr. Minsoo Kim, Samsung Electronics;
Mr. Gijong Sung, Samsung Electronics;
Dr. Incheol Nam, Samsung Electronics;
Mr. Changsoo Lee, Samsung Electronics;
Mr. Heeil Hong, Samsung Electronics;
Dr. Sangjun Hwang, Samsung Electronics
11:10 AM
Determining Optimal FIB Access Points using DFT-guided Simulation Data
Shaleen Acharya, Siemens;
Manish Sharma, Siemens;
Jayant D'Souza, Siemens;
Rudolf Schlangen, nVIDIA Corporation;
Arpan Bhattacherjee, NVIDIA Corporation;
Ankur Saxena, Nvidia;
Jennifer Huening, nVIDIA Corporation;
Dr. William Lo, NVIDIA;
Renliang Yuan, NVIDIA Corporation;
Jane Li, NVIDIA Corporation
