35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Author Index P

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Author Index: P

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Pearson, S.
25270
Pecht, M.
25259, 25260
Perdu, P.
25264
Perdu, P.
25219, 25225
Pham, T.
25226
Phang, J.
25291, 25307
Phunyapinuant, S.
25311
Picart, B.
25298
Pious, B.
25152
Polonsky, S. V.
25230
Pouget, V.
25298
Putman, A. J.
25313
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z