Case Studies and the Failure Analysis Process I

Tuesday, November 11, 2014: 2:35 PM-4:40 PM
310 B (George R. Brown Convention Center )
Session Chairs:
Dr. Zhigang Song and Prof. Peter Jacob
2:35 PM
Understanding the Cu Void Formation by TEM Failure Analysis
Dr. Binghai Liu, GLOBALFOUNDRIES Singapore; Dr. Jie Zhu, GLOBALFOUNDRIES Singapore; Mr. Eddie Er, GLOBALFOUNDRIES Singapore; Dr. Si Ping Zhao, Globalfoundries Singapore; Dr. Jeffrey Lam, GLOBALFOUNDRIES; Dr. Changqing Chen, Globalfoundries Singapore; Mr. Mark Najarian, FEI
3:00 PM
Failure Analysis Methodology on Systematic Missing Cu in RAM Due to Cu CMP
Mr. Ang Ghim Boon, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. Changqing Chen, GLOBALFOUNDRIES Singapore Pte Ltd; Ms. Hui Peng Ng, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. Alfred C.T. Quah, GLOBALFOUNDRIES Singapore Pte Ltd; Ms. Angela Teo, GLOBALFOUNDRIES Singapore Pte Ltd; Mr. Kim Hong Yip, GLOBALFOUNDRIES Singapore Pte Ltd; Ms. Soh Ping Neo, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. Jeffrey Lam, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. Zhihong Mai, GLOBALFOUNDRIES Singapore Pte Ltd
3:25 PM
Identification of Subtle Defect By Means of High Kev SEM Passive Voltage Contrast
Dr. Sujing Xie, Maxim Integrated; Ms. Chaoying Chen, Maxim Integrated; Mr. Nathan Wang, Maxim Integrated; Dr. Andrew Komrowski, Maxim Integrated; Ms. Qindi Wu, Maxim Integrated; Mr. Saunil Shah, Maxim Integrated
3:50 PM
Inline Defects Overlaying with Functional Failures and Characterization for Fast Defect Learning and Fast Yield Improvement
Dr. Zhigang Song, IBM Systems & Technology; Dr. Oliver D. Patterson, IBM Systems & Technology; Dr. Qian Xu, IBM Systems & Technology
4:15 PM
Observation of Channel Strain Release in pMOS Device with Low Idsat Using Energy-Filtered Nano-Beam Diffraction Technique
Dr. Jie Zhu, GLOBALFOUNDRIES Singapore; Ms. Elizabeth Sebastian, GLOBALFOUNDRIES Singapore
See more of: Symposium