Nanoprobing, Electrical Characterization I
Friday, November 1, 2024: 8:00 AM-10:00 AM
202 (Hilton San Diego Bayfront)
Mr. Dave Albert, IBM (Retired) and Mr. JOHN sanders, Thermofisher
9:00 AM
Revolutionizing Failure Analysis: EBAC Nanoprobing Analysis Insights into Inaccessible Floating Gates of Advanced Tech Node Automotive NVMs
Mr. P. K. Tan, Globalfoundries Singapore Ltd.;
Dr. S. L. Ting, Globalfoundries Singapore Pte Ltd.;
Ms. H. H. W. Thoungh, Globalfoundries Singapore Pte Ltd.;
Mr. P.T. Ng, Globalfoundries Singapore Pte Ltd.;
Dr. Alfred quah, GLOBALFOUNDRIES Singapore Pte Ltd;
Dr. N.Y. Xu, Globalfoundries Singapore Ltd.;
Ms. T.T. Yu, Globalfoundries Singapore Pte Ltd.;
Ms. Jessica S.J. Oh, Globalfoundries Singapore Ltd.;
Ms. Angela Teo, Globalfoundries Singapore;
Mr. Yong Seng Tam, Globalfoundries Singapore Ltd.;
Mr. K.K. Kang, Globalfoundries Singapore Ltd.;
Dr. Chang Qing Chen, GLOBALFOUNDRIES Singapore Pte Ltd
9:20 AM
Pluck-and-Probe method for EBIRCH isolation of wordline defects in 3D replacement gate NAND
Mr. Chandler Rich, Micron Technology, Inc.;
Dr. Wayne Harlow, Micron Technology, Inc.;
Becky Munoz, Micron Technology, Inc.;
Regino Sandoval, Micron Technology, Inc.;
William Crow, Micron Technology, Inc.;
Erik Jensen, Micron Technology, Inc.;
J. Temo Davis, Micron Technology, Inc.;
Dr. H. M. Ashfiqul Hamid, Micron Technology, Inc.
