52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Author Index: Y
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B. P. Yabut
65321
K. Yahyaei
65646
T. Yan
66084
H. Yanagita
65324
J. Yang
66224
K. Yang
66123
M. K. Yau
66064
Y. S. Yen
65903
G. You
66196
R. Yuan
66537
,
66561
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