Electrical Characterization and Nanoprobing
Tuesday, November 11, 2014: 9:55 AM-12:00 PM
310 B (George R. Brown Convention Center )
Session Chairs:
Dr. Stefan B. Kaemmer
and
Mr. Izak Kapilevich
10:45 AM
Utilizing Nanoprobing and Circuit Diagnostics to Identify Key Failure Mechanism of Otherwise Non-Visible Defects in 20nm Logic Devices
Dr. M. K. Dawood, Globalfoundries Singapore Pte. Ltd.;
Dr. Changqing Chen, Globalfoundries Singapore;
Mr. P.K. Tan, Globalfoundries Singapore Pte. Ltd.;
Ms. Sabitha James, Globalfoundries Singapore Pte. Ltd.;
Mr. Pariyarathu Salimon Limin, Globalfoundries Singapore Pte. Ltd.;
H. Tan, Globalfoundries Singapore Pte. Ltd.;
Mr. H.H. Yap, Global Foundries;
Mr. G.R. Low, Globalfoundries Singapore Pte. Ltd.;
J. C. Lam, GLOBALFOUNDRIES Singapore Pte Ltd;
Dr. Z.H. Mai, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Dayanand Nagalingam, GLOBALFOUNDRIES Singapore Pte Ltd
11:10 AM
Failure Analysis of Bit Line to SNC Leakage Fail in 2xnm DRAM Using Nano Probing Technique
Mr. Jaeho Won, SK hynix;
Mr. Jundong Kim, SK hynix;
Mrs. Jina Kim, SK hynix;
Mrs. Jihye Shin, SK hynix;
Mr. Jihoon Kim, SK hynix;
Ms. Kyungrim Lee, SK hynix;
Ms. Miae Yoon, SK hynix;
Mr. Jong Hak Lee, SK Hynix Semiconductor Inc;
Mr. Jaeyun Lee, SK Hynix Semiconductor Inc;
Mr. Weonjoon Suh, SK hynix;
Dr. Hyeonsoo Kim, SK hynix