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Sunday, November 2, 2008
8:00 AM-8:10 AM
Tutorial Welcome
8:15 AM-10:15 AM
Tutorial Lab Management
8:15 AM-12:00 PM
Tutorial FA Basics
8:15 AM-5:30 PM
Tutorial Yield, Test and Diagnostics
10:30 AM-2:15 PM
Tutorial EOS/ESD
1:00 PM-5:15 PM
Tutorial FIB
2:15 PM-4:30 PM
Tutorial Materials Characterization
4:30 PM-6:45 PM
Tutorial Analog Device Failure Analysis
5:15 PM-6:45 PM
Tutorial Failure Mechanisms
5:30 PM-6:45 PM
Tutorial Emerging Technologies
Monday, November 3, 2008
8:00 AM-12:00 PM
Tutorial Device and Memory FA
8:00 AM-3:45 PM
Tutorial Packaging
8:00 AM-6:30 PM
Tutorial Fault Isolation
1:00 PM-6:30 PM
Tutorial Microscopy Tools
4:00 PM-6:30 PM
Tutorial MEMS Devices
6:30 PM-6:45 PM
Tutorial Tutorial Closing Remarks and Prize Drawing
Tuesday, November 4, 2008
8:00 AM-9:30 AM
Symposium Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2008 Best Paper Award/TCP Introduction
9:40 AM-11:20 AM
Symposium Session 1: Emerging Concepts
12:20 PM-3:00 PM
Symposium Session 2: Package and Assembly Level FA I
Symposium Session 3: Failure Analysis Process I
3:10 PM-5:50 PM
Symposium Session 4: Package and Assembly Level FA II
Symposium Session 5: Circuit-Edit
6:00 PM-9:00 PM
Symposium User Groups
Wednesday, November 5, 2008
8:00 AM-9:40 AM
Symposium Session 6: Sample Preparation I
Symposium Session 7: Photon Based Techniques I
9:50 AM-11:30 AM
Symposium Session 8: Scanned Probe Microscopy
Symposium Session 9: Photon Based Techniques II
12:45 PM-2:00 PM
Symposium Session 10: Posters
3:00 PM-4:40 PM
Symposium Session 11: System Level Failure Analysis
Symposium Session 12: Sample Preparation II
4:50 PM-6:05 PM
Symposium Session 13: Test
Symposium Session 14: Photon Based Techniques III
6:45 PM-8:15 PM
Symposium Networking Social at the World Forestry Center
Thursday, November 6, 2008
8:00 AM-9:30 AM
Symposium Panel Discussion
9:40 AM-11:45 AM
Symposium Session 15: Nanoprobing
Symposium Session 16: Yield Enhancement
12:45 PM-2:50 PM
Symposium Session 17: Failure Analysis Process II
Symposium Session 18: Metrology

View The 34th International Symposium for Testing and Failure Analysis (November 2-6 2008) At a Glance