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Program-at-a-Glance
Technical Program
SUNDAY
November 2
MONDAY
November 3
TUESDAY
November 4
WEDNESDAY
November 5
THURSDAY
November 6
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PM
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PM
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Symposium
Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2008 Best Paper Award/TCP Introduction
8:00 AM - 9:30 AM
Session 1: Emerging Concepts
9:40 AM - 11:20 AM
Session 2: Package and Assembly Level FA I
12:20 PM - 3:00 PM
Session 3: Failure Analysis Process I
12:20 PM - 3:00 PM
Session 4: Package and Assembly Level FA II
3:10 PM - 5:50 PM
Session 5: Circuit-Edit
3:10 PM - 5:50 PM
User Groups
6:00 PM - 9:00 PM
Session 6: Sample Preparation I
8:00 AM - 9:40 AM
Session 7: Photon Based Techniques I
8:00 AM - 9:40 AM
Session 8: Scanned Probe Microscopy
9:50 AM - 11:30 AM
Session 9: Photon Based Techniques II
9:50 AM - 11:30 AM
Session 10: Posters
12:45 PM - 2:00 PM
Session 11: System Level Failure Analysis
3:00 PM - 4:40 PM
Session 12: Sample Preparation II
3:00 PM - 4:40 PM
Session 13: Test
4:50 PM - 6:05 PM
Session 14: Photon Based Techniques III
4:50 PM - 6:05 PM
Networking Social at the World Forestry Center
6:45 PM - 8:15 PM
Panel Discussion
8:00 AM - 9:30 AM
Session 15: Nanoprobing
9:40 AM - 11:45 AM
Session 16: Yield Enhancement
9:40 AM - 11:45 AM
Session 17: Failure Analysis Process II
12:45 PM - 2:50 PM
Session 18: Metrology
12:45 PM - 2:50 PM
Tutorial
Welcome
8:00 AM - 8:10 AM
Lab Management
8:15 AM - 10:15 AM
FA Basics
8:15 AM - 12:00 PM
Yield, Test and Diagnostics
8:15 AM - 5:30 PM
EOS/ESD
10:30 AM - 2:15 PM
FIB
1:00 PM - 5:15 PM
Materials Characterization
2:15 PM - 4:30 PM
Analog Device Failure Analysis
4:30 PM - 6:45 PM
Failure Mechanisms
5:15 PM - 6:45 PM
Emerging Technologies
5:30 PM - 6:45 PM
Device and Memory FA
8:00 AM - 12:00 PM
Packaging
8:00 AM - 3:45 PM
Fault Isolation
8:00 AM - 6:30 PM
Microscopy Tools
1:00 PM - 6:30 PM
MEMS Devices
4:00 PM - 6:30 PM
Tutorial Closing Remarks and Prize Drawing
6:30 PM - 6:45 PM
