ISTFA Home      Exposition      To Register      ASM Homepage
Back to Main Search.

Search for: search instructions
Match: Sort by:  
     Last Database Build: Mon Apr 18 04:13:09 EDT 2011

 
 Sunday, November 12, 2006
 8:15 AM-12:00 PM
Tutorial
Device and Memory FA
 
Tutorial
FA Basics
 
 8:15 AM-2:45 PM
Tutorial
Packaging
 
 1:00 PM-3:30 PM
Tutorial
Failure Mechanisms
 
 1:00 PM-6:45 PM
Tutorial
Microscopy Tools
 
 2:45 PM-6:45 PM
Tutorial
EOS/ESD
 
 3:45 PM-6:45 PM
Tutorial
Emerging Technologies
 
 
 Monday, November 13, 2006
 8:00 AM-9:00 AM
Tutorial
Yield
 
 8:00 AM-10:15 AM
Tutorial
Focused Ion Beam
 
 8:00 AM-4:15 PM
Tutorial
Test and Logic Diagnostics
 
 9:00 AM-6:15 PM
Tutorial
Fault Isolation
 
 10:30 AM-3:00 PM
Tutorial
MEMS Devices
 
 3:15 PM-4:45 PM
Tutorial
Lead Free Packaging
 
 4:15 PM-6:15 PM
Tutorial
Lab Management
 
 4:45 PM-6:15 PM
Tutorial
Materials Characterization
 
 
 Tuesday, November 14, 2006
 10:15 AM-11:30 AM
Symposium
Session 1: Advanced Techniques 1
 
 1:30 PM-2:45 PM
Symposium
Session 2: System Level Analysis
 
Symposium
Session 3: Test and Diagnostics
 
 3:05 PM-4:45 PM
Symposium
Session 5: Scanning Probe Microscopy
 
 3:05 PM-5:10 PM
Symposium
Session 4: Circuit Edit and Beam-based Sample Preparation
 
 5:30 PM-7:30 PM
Symposium
Session 6: Panel Discussion
 
 
 Wednesday, November 15, 2006
 10:20 AM-11:35 AM
Symposium
Session 7: Package Level Analysis 1
 
 10:20 AM-12:25 PM
Symposium
Session 8: Discretes, Passives, MEMS, and Optoelectronics
 
 12:25 PM-2:25 PM
Symposium
Session 9: Posters
 
 3:55 PM-6:00 PM
Symposium
Session 10: Metrology and Materials Analysis 1
 
Symposium
Session 11: Die Level Fault Isolation
 
 
 Thursday, November 16, 2006
 8:00 AM-9:15 AM
Symposium
Session 13: Chemical and Mechanical Sample Preparation
 
 8:00 AM-9:40 AM
Symposium
Session 12: Metrology and Materials Analysis 2
 
 9:55 AM-12:00 PM
Symposium
Session 14: Advanced Techniques 2
 
Symposium
Session 15: Yield Analysis
 
 1:20 PM-3:00 PM
Symposium
Session 16: Optical Fault Isolation
 
Symposium
Session 17: Analytical Process
 
 3:15 PM-4:55 PM
Symposium
Session 18: Package Level Analysis 2
 
 3:15 PM-5:20 PM
Symposium
Session 19: Nanotechnology and Nanoprobing
 


View The 32nd International Symposium for Testing and Failure Analysis Conference And Exposition (November 12-16, 2006) At a Glance