ISTFA Home
Exposition
To Register
ASM Homepage
Back to Main Search
.
If you would like to see a list of authors, please use the
Author Index
Search for:
search instructions
Match:
All words
Any word
Boolean
Sort by:
Relevance
Title
Last Database Build: Mon Apr 18 04:13:09 EDT 2011
 
Sunday, November 12, 2006
8:15 AM-12:00 PM
Tutorial
Device and Memory FA
Tutorial
FA Basics
8:15 AM-2:45 PM
Tutorial
Packaging
1:00 PM-3:30 PM
Tutorial
Failure Mechanisms
1:00 PM-6:45 PM
Tutorial
Microscopy Tools
2:45 PM-6:45 PM
Tutorial
EOS/ESD
3:45 PM-6:45 PM
Tutorial
Emerging Technologies
 
Monday, November 13, 2006
8:00 AM-9:00 AM
Tutorial
Yield
8:00 AM-10:15 AM
Tutorial
Focused Ion Beam
8:00 AM-4:15 PM
Tutorial
Test and Logic Diagnostics
9:00 AM-6:15 PM
Tutorial
Fault Isolation
10:30 AM-3:00 PM
Tutorial
MEMS Devices
3:15 PM-4:45 PM
Tutorial
Lead Free Packaging
4:15 PM-6:15 PM
Tutorial
Lab Management
4:45 PM-6:15 PM
Tutorial
Materials Characterization
 
Tuesday, November 14, 2006
10:15 AM-11:30 AM
Symposium
Session 1: Advanced Techniques 1
1:30 PM-2:45 PM
Symposium
Session 2: System Level Analysis
Symposium
Session 3: Test and Diagnostics
3:05 PM-4:45 PM
Symposium
Session 5: Scanning Probe Microscopy
3:05 PM-5:10 PM
Symposium
Session 4: Circuit Edit and Beam-based Sample Preparation
5:30 PM-7:30 PM
Symposium
Session 6: Panel Discussion
 
Wednesday, November 15, 2006
10:20 AM-11:35 AM
Symposium
Session 7: Package Level Analysis 1
10:20 AM-12:25 PM
Symposium
Session 8: Discretes, Passives, MEMS, and Optoelectronics
12:25 PM-2:25 PM
Symposium
Session 9: Posters
3:55 PM-6:00 PM
Symposium
Session 10: Metrology and Materials Analysis 1
Symposium
Session 11: Die Level Fault Isolation
 
Thursday, November 16, 2006
8:00 AM-9:15 AM
Symposium
Session 13: Chemical and Mechanical Sample Preparation
8:00 AM-9:40 AM
Symposium
Session 12: Metrology and Materials Analysis 2
9:55 AM-12:00 PM
Symposium
Session 14: Advanced Techniques 2
Symposium
Session 15: Yield Analysis
1:20 PM-3:00 PM
Symposium
Session 16: Optical Fault Isolation
Symposium
Session 17: Analytical Process
3:15 PM-4:55 PM
Symposium
Session 18: Package Level Analysis 2
3:15 PM-5:20 PM
Symposium
Session 19: Nanotechnology and Nanoprobing
View The 32nd International Symposium for Testing and Failure Analysis Conference And Exposition (November 12-16, 2006) At a Glance