The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009)

The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM


Sunday, November 15, 2009
8:00 AM-8:10 AM
Tutorial Tutorial Welcome
8:15 AM-4:30 PM
Tutorial Technology-Specific FA
8:30 AM-4:45 PM
Tutorial Fault Isolation
10:30 AM-4:45 PM
Tutorial Die and Defect Access

Monday, November 16, 2009
8:00 AM-12:00 PM
Tutorial Fault Isolation
8:00 AM-2:15 PM
Tutorial Technology-Specific FA
8:15 AM-5:00 PM
Tutorial Microscopy
1:45 PM-3:15 PM
Tutorial The Periphery of FA
2:15 PM-4:30 PM
Tutorial Lab Management
3:30 PM-5:45 PM
Tutorial FIB
4:30 PM-5:30 PM
Tutorial The Periphery of FA

Tuesday, November 17, 2009
8:00 AM-10:00 AM
Symposium Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2009 Best Paper Award/TCP Introduction
10:00 AM-12:05 PM
Symposium Session 1: Emerging Concepts
1:30 PM-3:35 PM
Symposium Session 2: Photon Beam Based Techniques - 1
Symposium Session 3: Nanoprobing
4:00 PM-6:00 PM
Symposium User's Group 1: Optical Techniques - "Growth and Limitations"
Symposium User's Group 2: Resolution of Nanoprobing

Wednesday, November 18, 2009
8:00 AM-9:40 AM
Symposium Session 4: Circuit-Edit
Symposium Session 5: Sample Preparation
10:00 AM-11:40 AM
Symposium Session 6: Alternative Energy
12:05 PM-1:30 PM
Symposium EDFAS General Membership Meeting/Networking Luncheon
1:30 PM-2:30 PM
Symposium Expo Only Hour
2:30 PM-4:00 PM
Symposium Session 7: Posters
4:00 PM-6:00 PM
Symposium User's Group 3: FIB
Symposium User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation
6:00 PM-8:00 PM
Symposium Panel Discussion: FA Career Roadmap and Networking Event

Thursday, November 19, 2009
8:00 AM-9:40 AM
Symposium Session 8: Photon Beam Based Techniques - 2
8:00 AM-10:05 AM
Symposium Session 9: Package and Assembly Level FA
10:15 AM-11:30 AM
Symposium Session 10: Failure Analysis Process
Symposium Session 11: Advanced Metrology and System Level FA