The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
Program-at-a-Glance
Technical Program
SUNDAY
November 15
MONDAY
November 16
TUESDAY
November 17
WEDNESDAY
November 18
THURSDAY
November 19
AM
PM
AM
PM
AM
PM
AM
PM
AM
PM
Symposium
Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2009 Best Paper Award/TCP Introduction
8:00 AM - 10:00 AM
Session 1: Emerging Concepts
10:00 AM - 12:05 PM
Session 2: Photon Beam Based Techniques - 1
1:30 PM - 3:35 PM
Session 3: Nanoprobing
1:30 PM - 3:35 PM
User's Group 1: Optical Techniques - "Growth and Limitations"
4:00 PM - 6:00 PM
User's Group 2: Resolution of Nanoprobing
4:00 PM - 6:00 PM
Session 4: Circuit-Edit
8:00 AM - 9:40 AM
Session 5: Sample Preparation
8:00 AM - 9:40 AM
Session 6: Alternative Energy
10:00 AM - 11:40 AM
EDFAS General Membership Meeting/Networking Luncheon
12:05 PM - 1:30 PM
Expo Only Hour
1:30 PM - 2:30 PM
Session 7: Posters
2:30 PM - 4:00 PM
User's Group 3: FIB
4:00 PM - 6:00 PM
User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation
4:00 PM - 6:00 PM
Panel Discussion: FA Career Roadmap and Networking Event
6:00 PM - 8:00 PM
Session 8: Photon Beam Based Techniques - 2
8:00 AM - 9:40 AM
Session 9: Package and Assembly Level FA
8:00 AM - 10:05 AM
Session 10: Failure Analysis Process
10:15 AM - 11:30 AM
Session 11: Advanced Metrology and System Level FA
10:15 AM - 11:30 AM
Tutorial
Tutorial Welcome
8:00 AM - 8:10 AM
Technology-Specific FA
8:15 AM - 4:30 PM
Fault Isolation
8:30 AM - 4:45 PM
Die and Defect Access
10:30 AM - 4:45 PM
Fault Isolation
8:00 AM - 12:00 PM
Technology-Specific FA
8:00 AM - 2:15 PM
Microscopy
8:15 AM - 5:00 PM
The Periphery of FA
1:45 PM - 3:15 PM
Lab Management
2:15 PM - 4:30 PM
FIB
3:30 PM - 5:45 PM
The Periphery of FA
4:30 PM - 5:30 PM
