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Sunday, November 14, 2010
8:00 AM-8:15 AM
Tutorial 1 Tutorial Welcome
8:15 AM-5:00 PM
Tutorial 2 Fault Isolation
8:15 AM-5:15 PM
Tutorial 3 Technology-Specific Failure Analysis
10:30 AM-2:00 PM
Tutorial 4 The Periphery of Failure Analysis
2:15 PM-5:00 PM
Tutorial 5 FIB
Monday, November 15, 2010
8:00 AM-12:00 PM
Tutorial 6 Technology-Specific Failure Analysis
8:00 AM-2:00 PM
Tutorial 7 Fault Isolation
8:00 AM-5:00 PM
Tutorial 8 Microscopy
1:00 PM-5:45 PM
Tutorial 9 Die and Defect Access
2:30 PM-3:45 PM
Tutorial 10 FA Lab Management
Tuesday, November 16, 2010
8:00 AM-9:40 AM
Symposium Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2010 Best Paper Award/TCP Introduction
10:00 AM-12:05 PM
Symposium 1 Session 1: Emerging FA Techniques and Concepts
1:20 PM-2:35 PM
Symposium 2 Session 3: Packaging and Assembly Level FA I
1:20 PM-3:50 PM
Symposium 3 Session 2: FA Process/Case Studies
2:35 PM-3:50 PM
Symposium 4 Session 4: Sample Preparation for Technological Analysis
4:05 PM-5:20 PM
Symposium 5 Session 5: Defect Characterization & Metrology - I
Symposium 6 Session 6: Sample Prep for Chip Access and Device Deprocessing
5:20 PM-7:00 PM
Symposium User's Group 1: SEM
Symposium User's Group 2: Sample Preparation
Wednesday, November 17, 2010
8:00 AM-9:40 AM
Symposium 7 Session 7: Alternative Energy (Photovoltaics, Solid State Lighting, etc.)
8:00 AM-10:05 AM
Symposium 8 Session 8: Sample Prep for Chip Access and Device Deprocessing 2
10:20 AM-11:35 AM
Symposium 9 Session 9: Board and System Level FA
10:20 AM-12:00 PM
Symposium 10 Session 10: Photon Based Techniques I
12:00 PM-1:10 PM
Symposium EDFAS General Membership Meeting & Networking Luncheon
1:10 PM-2:10 PM
Symposium Expo Only Hour
2:10 PM-3:10 PM
Symposium 11 Session 11: Posters
3:10 PM-4:50 PM
Symposium 12 Session 13: Defect Characterization & Metrology - II
3:10 PM-5:15 PM
Symposium 13 Session 12: MEMS, Discretes and Optoelectronic Device FA
4:50 PM-6:30 PM
Symposium 14 Session 14: Test and Diagnostic, Test and Debug
5:15 PM-6:05 PM
Symposium 15 Session 15: Cicuit Edit I
Thursday, November 18, 2010
8:00 AM-9:40 AM
Symposium 16 Session 16: Counterfeit Electronics – Risks and Mitigation
9:40 AM-10:35 AM
Symposium Panel Discussion
10:50 AM-12:55 PM
Symposium 17 Session 17: Photon Based Techniques II
Symposium 18 Session 18: Nanoprobing and Nano Scale Electronic Characterization
1:55 PM-3:10 PM
Symposium 19 Session 19: Circuit Edit II (Laser, FIB, etc.)
1:55 PM-3:35 PM
Symposium User's Group 4: Nanoprobing
3:10 PM-4:50 PM
Symposium User's Group 3: FIB
3:35 PM-4:50 PM
Symposium 20 Session 20: Packaging and Assembly Level FA II

View The 36th International Symposium for Testing and Failure Analysis (November 14-18, 2010) At a Glance