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Sunday, November 14, 2004
8:00 AM-12:15 PM
Tutorial Device and Test 1
8:15 AM-12:15 PM
Tutorial Microscopy Tools 1
Tutorial Packaging 1
12:15 PM-6:30 PM
Tutorial Device and Test 2
Tutorial Microscopy Tools 2
Tutorial Yield
Monday, November 15, 2004
8:00 AM-12:15 PM
Tutorial Fault Isolation 1
Tutorial MEMS
Tutorial Packaging 2
12:15 PM-2:30 PM
Tutorial Fault Isolation 2
12:15 PM-3:45 PM
Tutorial Sample Preparation
12:15 PM-6:00 PM
Tutorial Device and Test 3
2:30 PM-5:45 PM
Tutorial Failure Mechanisms
3:45 PM-5:45 PM
Tutorial Failure Analysis Management
Tuesday, November 16, 2004
8:45 AM-9:10 AM
Symposium Session 1: Nanotechnology
9:10 AM-11:10 AM
Symposium Session 2: Advanced Techniques
11:10 AM-1:30 PM
Symposium Session 3: SPM Techniques 1
Symposium Session 4: Test 1
1:30 PM-3:55 PM
Symposium Session 5: Package Level Analysis 1
Symposium Session 6: Die Level Fault Isolation
3:55 PM-5:40 PM
Symposium Session 7: Failure Analysis Process 1
Symposium Session 8: Circuit Edit for FA, FI and Debug 1
Wednesday, November 17, 2004
8:00 AM-9:35 AM
Symposium Session 10: Optical Techniques 1
Symposium Session 9: Test 2
9:35 AM-1:45 PM
Symposium Session 11: Panel Discussion
Symposium Session 12: MEMS
11:40 AM-1:45 PM
Symposium Poster
1:45 PM-4:10 PM
Symposium Session 13: Metrology and Materials Analysis 1
Symposium Session 14: System Level Analysis 1
4:10 PM-5:50 PM
Symposium Session 15: Optoelectronic Devices
Symposium Session 16: Sample Preparation 1
Thursday, November 18, 2004
8:00 AM-10:25 AM
Symposium Session 17: SPM Techniques 2
Symposium Session 18: Package Level Analysis 2
Symposium Session 19: Yield Enhancement
10:25 AM-12:40 PM
Symposium Session 20: Metrology and Materials Analysis 2
Symposium Session 21: System Level Analysis 2
Symposium Session 22: Optical Techniques 2
12:40 PM-3:05 PM
Symposium Session 23: Metrology and Materials Analysis 3
Symposium Session 24: SPM Techniques 3
Symposium Session 25: Failure Analysis Process 2
3:05 PM-4:45 PM
Symposium Session 28: Test 3
3:05 PM-5:00 PM
Symposium Session 26: Circuit Edit for FA, FI and Debug 2
Symposium Session 27: Sample Preparation 2

View The 30th International Symposium for Testing and Failure Analysis Conference and Exposition (November 14-18, 2004) At a Glance