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Sunday, November 6, 2005
8:00 AM-8:10 AM
Tutorial Introduction
8:15 AM-10:30 AM
Tutorial Failure Analysis Basics
8:15 AM-12:00 PM
Tutorial Device and Test 1
Tutorial Packaging 1
10:30 AM-12:00 PM
Tutorial Microscopy Tools 1
1:00 PM-3:30 PM
Tutorial Yield
1:00 PM-6:30 PM
Tutorial Device and Test 2
Tutorial Microscopy Tools 2
3:30 PM-6:30 PM
Tutorial Sample Preparation
Monday, November 7, 2005
8:00 AM-12:00 PM
Tutorial Fault Isolation 1
Tutorial MEMS
Tutorial Packaging 2
1:00 PM-3:30 PM
Tutorial Fault Isolation 2
1:00 PM-4:15 PM
Tutorial Device and Test 3
1:00 PM-6:15 PM
Tutorial Microscopy Tools 3
3:45 PM-6:15 PM
Tutorial Failure Mechanisms
4:15 PM-6:15 PM
Tutorial Failure Analysis Laboratory Management
6:15 PM-6:30 PM
Tutorial Prize Drawing
7:00 PM-8:30 PM
Symposium Scanning Optical Microscopy (SOM) User Group
Tuesday, November 8, 2005
9:25 AM-10:40 AM
Symposium Session 1: Advanced Techniques 1
11:00 AM-12:40 PM
Symposium Session 2: Package Level Analysis 1
Symposium Session 3: Die Level Fault Isolation
1:00 PM-2:40 PM
Symposium Session 4: Panel Discussion 1: Strategic Development in FA. What Can We Get From Other Technical Sources?
Symposium Session 5: Panel Discussion 2: Can Competitors Build Some Common FA Facilities To Improve ROI And Efficiency?
3:00 PM-4:40 PM
Symposium Session 6: Circuit Edit for FA, FI, and Debug
Symposium Session 7: Case Histories 1
4:45 PM-5:15 PM
Symposium EDFAS General Membership Meeting
7:00 PM-8:30 PM
Symposium Focused Ion Beam (FIB) User Group
Symposium Scanning Probe Microscopy (SPM) User Group
Wednesday, November 9, 2005
8:00 AM-9:40 AM
Symposium Session 8: Optical Techniques 1
Symposium Session 9: System Level Analysis 1
10:00 AM-11:15 AM
Symposium Session 10: Advanced Techniques 2
Symposium Session 11: Case Histories 2
11:15 AM-1:15 PM
Symposium Session 12: Poster/Luncheon
2:15 PM-3:55 PM
Symposium Session 13: Failure Analysis Process
Symposium Session 14: SPM Techniques 1
4:15 PM-5:55 PM
Symposium Session 15: Sample Preparation 1
Symposium Session 16: Optoelectronic Devices
7:00 PM-8:30 PM
Symposium Chip Access/Delayering User Group
Symposium Nano Probe User Group
Thursday, November 10, 2005
8:00 AM-9:15 AM
Symposium Session 17: Optical Techniques 2
Symposium Session 18: Nanotechnology Analysis
9:25 AM-11:30 AM
Symposium Session 19: Yield Enhancement
Symposium Session 20: Discretes, Passives, and MEMS
1:00 PM-3:05 PM
Symposium Session 21: Metrology and Materials Analysis
Symposium Session 22: System Level 2/Packaging 2/SPM 2
3:25 PM-4:40 PM
Symposium Session 23: Sample Preparation 2
Symposium Session 24: Test

View The 31st International Symposium for Testing and Failure Analysis Conference and Exposition (November 6-10, 2005) At a Glance