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     Last Database Build: Mon Apr 18 04:13:09 EDT 2011

 
 Sunday, November 6, 2005
 8:00 AM-8:10 AM
Tutorial
Introduction
 
 8:15 AM-10:30 AM
Tutorial
Failure Analysis Basics
 
 8:15 AM-12:00 PM
Tutorial
Device and Test 1
 
Tutorial
Packaging 1
 
 10:30 AM-12:00 PM
Tutorial
Microscopy Tools 1
 
 1:00 PM-3:30 PM
Tutorial
Yield
 
 1:00 PM-6:30 PM
Tutorial
Device and Test 2
 
Tutorial
Microscopy Tools 2
 
 3:30 PM-6:30 PM
Tutorial
Sample Preparation
 
 
 Monday, November 7, 2005
 8:00 AM-12:00 PM
Tutorial
Fault Isolation 1
 
Tutorial
MEMS
 
Tutorial
Packaging 2
 
 1:00 PM-3:30 PM
Tutorial
Fault Isolation 2
 
 1:00 PM-4:15 PM
Tutorial
Device and Test 3
 
 1:00 PM-6:15 PM
Tutorial
Microscopy Tools 3
 
 3:45 PM-6:15 PM
Tutorial
Failure Mechanisms
 
 4:15 PM-6:15 PM
Tutorial
Failure Analysis Laboratory Management
 
 6:15 PM-6:30 PM
Tutorial
Prize Drawing
 
 7:00 PM-8:30 PM
Symposium
Scanning Optical Microscopy (SOM) User Group
 
 
 Tuesday, November 8, 2005
 9:25 AM-10:40 AM
Symposium
Session 1: Advanced Techniques 1
 
 11:00 AM-12:40 PM
Symposium
Session 2: Package Level Analysis 1
 
Symposium
Session 3: Die Level Fault Isolation
 
 1:00 PM-2:40 PM
Symposium
Session 4: Panel Discussion 1: Strategic Development in FA. What Can We Get From Other Technical Sources?
 
Symposium
Session 5: Panel Discussion 2: Can Competitors Build Some Common FA Facilities To Improve ROI And Efficiency?
 
 3:00 PM-4:40 PM
Symposium
Session 6: Circuit Edit for FA, FI, and Debug
 
Symposium
Session 7: Case Histories 1
 
 4:45 PM-5:15 PM
Symposium
EDFAS General Membership Meeting
 
 7:00 PM-8:30 PM
Symposium
Focused Ion Beam (FIB) User Group
 
Symposium
Scanning Probe Microscopy (SPM) User Group
 
 
 Wednesday, November 9, 2005
 8:00 AM-9:40 AM
Symposium
Session 8: Optical Techniques 1
 
Symposium
Session 9: System Level Analysis 1
 
 10:00 AM-11:15 AM
Symposium
Session 10: Advanced Techniques 2
 
Symposium
Session 11: Case Histories 2
 
 11:15 AM-1:15 PM
Symposium
Session 12: Poster/Luncheon
 
 2:15 PM-3:55 PM
Symposium
Session 13: Failure Analysis Process
 
Symposium
Session 14: SPM Techniques 1
 
 4:15 PM-5:55 PM
Symposium
Session 15: Sample Preparation 1
 
Symposium
Session 16: Optoelectronic Devices
 
 7:00 PM-8:30 PM
Symposium
Chip Access/Delayering User Group
 
Symposium
Nano Probe User Group
 
 
 Thursday, November 10, 2005
 8:00 AM-9:15 AM
Symposium
Session 17: Optical Techniques 2
 
Symposium
Session 18: Nanotechnology Analysis
 
 9:25 AM-11:30 AM
Symposium
Session 19: Yield Enhancement
 
Symposium
Session 20: Discretes, Passives, and MEMS
 
 1:00 PM-3:05 PM
Symposium
Session 21: Metrology and Materials Analysis
 
Symposium
Session 22: System Level 2/Packaging 2/SPM 2
 
 3:25 PM-4:40 PM
Symposium
Session 23: Sample Preparation 2
 
Symposium
Session 24: Test
 


View The 31st International Symposium for Testing and Failure Analysis Conference and Exposition (November 6-10, 2005) At a Glance